DocumentCode :
1555248
Title :
Quantum well carrier sweep out: relation to electroabsorption and exciton saturation
Author :
Fox, A. Mark ; Miller, David A B ; Livescu, Gabriela ; Cunningham, J.E. ; Jan, William Y.
Author_Institution :
AT&T Bell Labs.. Holmdel, NJ, USA
Volume :
27
Issue :
10
fYear :
1991
fDate :
10/1/1991 12:00:00 AM
Firstpage :
2281
Lastpage :
2295
Abstract :
The authors studied the effects of changing the barrier design of GaAs-AlxGa1-xAs quantum wells on the electroabsorption, exciton saturation, and carrier sweep-out times. Five samples with x values ranging from 0.2 to 0.4 and barrier thicknesses from 35 to 95 Å were studied. Within this range, the authors find that the electroabsorption is not very sensitive to the barrier thickness, but that the ionization field of the excitons approximately doubles for an increase of x from 0.2 to 0.4. The samples with high, thick barriers have lower internal quantum efficiencies than those with low, thin barriers. It was found that the exciton saturation intensity increases with increasing applied field, and decreasing barrier thickness or height. Time-resolved electroabsorption measurements confirm the variation in sweep-out rates between samples, and indicate that the escape mechanism at low field is probably a thermally-assisted tunneling process
Keywords :
III-V semiconductors; aluminium compounds; electroabsorption; excitons; gallium arsenide; optical saturation; semiconductor quantum wells; 35 to 95 Å; GaAs-AlxGa1-xAs; applied field; barrier design; barrier thicknesses; electroabsorption; escape mechanism; exciton saturation; ionization field; lower internal quantum efficiencies; quantum well carrier sweep out; saturation intensity; semiconductors; sweep-out times; thermally-assisted tunneling process; time resolved measurements; Carrier confinement; Excitons; Helium; Ionization; Potential well; Senior members; Stark effect; Switches; Thermionic emission; Tunneling;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.97272
Filename :
97272
Link To Document :
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