Title :
A 77-GHz SiGe Integrated Six-Port Receiver Front-End for Angle-of-Arrival Detection
Author :
Laemmle, Benjamin ; Vinci, Gabor ; Maurer, Linus ; Weigel, Robert ; Koelpin, Alexander
Author_Institution :
Inst. for Electron. Eng., Univ. of Erlangen-Nuremberg, Erlangen, Germany
Abstract :
In this paper an integrated six-port receiver front-end for angle-of-arrival detection of 77-GHz signals is presented. Applications of the circuit are direction finding, automotive radar calibration, or high precision industrial radar. The measurement principle is based on passive superposition of two incident signals and power detection. The circuit features two input amplifiers, a broadband passive six-port network, and four power detectors. The integrated circuit has a power consumption of 95 mW with 5 V supply voltage. It is fabricated in a 200-GHz fT SiGe bipolar technology and occupies only 1028 × 1128 μm2. The circuit operates in a 3-dB bandwidth from 75 GHz to 84 GHz and has a responsivity of 152 kV/W at 80 GHz. A simple calibration method is proposed and all calibration parameters are calculated for different frequency values.
Keywords :
amplifiers; bipolar integrated circuits; broadband networks; calibration; direction-of-arrival estimation; passive networks; power consumption; power supply circuits; radar receivers; radio direction-finding; road vehicle radar; SiGe; angle-of-arrival detection; automotive radar calibration; bandwidth 75 GHz to 84 GHz; bipolar technology; broadband passive six-port network; calibration method; calibration parameters; direction finding; four power detectors; frequency 200 GHz; frequency 77 GHz; frequency values; high precision industrial radar; incident signals; input amplifiers; integrated circuit; integrated six-port receiver front-end; measurement principle; passive superposition; power 95 mW; power consumption; power detection; supply voltage; voltage 5 V; Antenna measurements; Bandwidth; Couplers; Detectors; Frequency measurement; Radar; Receivers; Angle-of-arrival; automotive radar; calibration; interferometer; phase measurement; six-port;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2012.2201271