• DocumentCode
    1555503
  • Title

    Theoretical and experimental characterization of coplanar waveguide discontinuities for filter applications

  • Author

    Dib, Nihad I. ; Katehi, Linda P B ; Ponchak, George E. ; Simons, Rainee N.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    873
  • Lastpage
    882
  • Abstract
    A full-wave analysis of shielded coplanar waveguide (CPW) two-port discontinuities based on the solution of an appropriate surface integral equation in the space domain is presented. Frequency-dependent scattering parameters for open-end and short-end CPW stubs are computed using this method. The numerically derived results are compared with measurements performed in the frequency range 5-25 GHz and show very good agreement. From the scattering parameters, lumped-element equivalent circuits have been derived to model the discontinuities. The inductors and capacitors of these models have been represented by closed-form equations, as functions of the stub length, to compute the circuit element values for these discontinuities
  • Keywords
    S-parameters; equivalent circuits; integral equations; microwave filters; passive filters; waveguide components; waveguide theory; 5 to 25 GHz; SHF; capacitors; closed-form equations; coplanar waveguide; filter applications; full-wave analysis; inductors; lumped-element equivalent circuits; model; open-end stub; scattering parameters; shielded CPW; short-end CPW stubs; stub length; surface integral equation; two-port discontinuities; Coplanar waveguides; Equivalent circuits; Frequency measurement; Inductors; Integral equations; Performance evaluation; Scattering parameters; Surface waves; Waveguide discontinuities; Waveguide theory;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.79116
  • Filename
    79116