Title :
Phase noise characterization of SAW oscillators based on a Newton minimization procedure
Author :
Klemer, David P. ; Shih, Ko-Ming ; Clark, Earl E., III
Author_Institution :
Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
fDate :
5/1/1991 12:00:00 AM
Abstract :
An iterative minimization technique is used to optimize the values of circuit and device parameters which determine the phase noise response of a voltage-controlled SAW-stabilized oscillator (VCSO). An expression-developed by T.E. Parker (1985) is used to calculate the double-sideband phase noise to carrier ratio from circuit parameter values; good agreement between calculations and phase noise measurements is achieved by minimizing the squared error through the use of a steepest-descent/Newton-Raphson minimization scheme. Less accurately known circuit parameters are thus optimized in an iterative fashion. Exact expressions for the elements of the Hessian Matrix are used in the Newton-Raphson procedure, allowing for fast computations. The numerical findings suggest that useful results can be obtained in the determination of VCSO circuit parameters
Keywords :
iterative methods; microwave oscillators; minimisation; radiofrequency oscillators; random noise; surface acoustic wave devices; Hessian Matrix; Newton minimization procedure; SAW oscillators; UHF; circuit parameter values; device parameters; double sideband phase noise/carrier ratio; iterative minimization; phase noise response; steepest-descent/Newton-Raphson minimization scheme; voltage-controlled; 1f noise; Circuits; Frequency; Minimization; Noise measurement; Phase measurement; Phase noise; Surface acoustic wave devices; Surface acoustic waves; Voltage-controlled oscillators;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on