• DocumentCode
    1555507
  • Title

    Phase noise characterization of SAW oscillators based on a Newton minimization procedure

  • Author

    Klemer, David P. ; Shih, Ko-Ming ; Clark, Earl E., III

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
  • Volume
    39
  • Issue
    5
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    883
  • Lastpage
    889
  • Abstract
    An iterative minimization technique is used to optimize the values of circuit and device parameters which determine the phase noise response of a voltage-controlled SAW-stabilized oscillator (VCSO). An expression-developed by T.E. Parker (1985) is used to calculate the double-sideband phase noise to carrier ratio from circuit parameter values; good agreement between calculations and phase noise measurements is achieved by minimizing the squared error through the use of a steepest-descent/Newton-Raphson minimization scheme. Less accurately known circuit parameters are thus optimized in an iterative fashion. Exact expressions for the elements of the Hessian Matrix are used in the Newton-Raphson procedure, allowing for fast computations. The numerical findings suggest that useful results can be obtained in the determination of VCSO circuit parameters
  • Keywords
    iterative methods; microwave oscillators; minimisation; radiofrequency oscillators; random noise; surface acoustic wave devices; Hessian Matrix; Newton minimization procedure; SAW oscillators; UHF; circuit parameter values; device parameters; double sideband phase noise/carrier ratio; iterative minimization; phase noise response; steepest-descent/Newton-Raphson minimization scheme; voltage-controlled; 1f noise; Circuits; Frequency; Minimization; Noise measurement; Phase measurement; Phase noise; Surface acoustic wave devices; Surface acoustic waves; Voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.79117
  • Filename
    79117