DocumentCode :
1555537
Title :
Band-edge aligned quaternary carrier barriers in InGaAs-AlGaAs high-power diode lasers for improved high-temperature operation
Author :
Wiedmann, Nicolas ; Schmitz, Johannes ; Boucke, Konstantin ; Herres, Nikolaus ; Wagner, Joachim ; Mikulla, Michael ; Poprawe, Reinhart ; Weimann, Günter
Author_Institution :
Fraunhofer-Inst. fur Angewandte Festkorperphys., Freiburg, Germany
Volume :
38
Issue :
1
fYear :
2002
fDate :
1/1/2002 12:00:00 AM
Firstpage :
67
Lastpage :
72
Abstract :
A new type of band-edge aligned carrier barrier is introduced into InGaAs-AlGaAs single quantum-well (SQW) high-power diode laser structures in order to prevent thermionic emission and the overflow of carriers at elevated operating temperatures. These barriers, which are located in the direct vicinity of the active zone of the laser, are undoped to avoid free-carrier absorption. An InGaAs-AlGaAs SQW laser structure with a 10-nm-thick AlGaAsSb electron-blocking layer on the p-side of an In0.2Ga0.8As quantum well was realized. The composition of this layer was adjusted so that its valence-band edge matches that of the adjacent AlGaAs waveguide layer. This is to prevent any additional voltage drop or series resistance due to the injection of holes into the quantum well through the electron blocking layer. These lasers show a high characteristic temperature T 0 of about 225 K for 1500-μm-long as-cleaved devices, which is about 60 K higher than the same laser structure without the blocking layer. Simultaneously low internal losses (αi≈1.5 cm-1 at 20°C) and high internal quantum efficiencies (ηi≈93% at 20°C) are achieved. No additional voltage drop or series resistance was measured. The higher temperature stability is mainly attributed to the suppression of carrier leakage and a reduced free-carrier absorption at elevated temperatures
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; optical losses; quantum well lasers; semiconductor device measurement; thermal stability; valence bands; 10 nm; 1500 micron; 20 C; 225 K; 93 percent; AlGaAs waveguide layer; AlGaAsSb electron-blocking layer; In0.2Ga0.8As quantum well; InGaAs-AlGaAs; InGaAs-AlGaAs SQW high-power diode laser structures; InGaAs-AlGaAs SQW laser structure; InGaAs-AlGaAs high-power diode lasers; InGaAs-AlGaAs single quantum-well high-power diode laser structures; as-cleaved devices; band-edge aligned carrier barriers; band-edge aligned quaternary carrier barriers; carrier leakage suppression; carrier overflow; characteristic temperature; electron blocking layer; elevated operating temperatures; free-carrier absorption; high-temperature operation; hole injection; internal losses; internal quantum efficiencies; laser active zone; laser structure; layer composition; quantum well; series resistance; temperature stability; thermionic emission; valence-band edge; voltage drop; Absorption; Charge carrier processes; Diode lasers; Electrical resistance measurement; Quantum well lasers; Temperature; Thermionic emission; Time of arrival estimation; Voltage; Waveguide lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.973321
Filename :
973321
Link To Document :
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