DocumentCode :
1555627
Title :
New Approaches for Making Large-Volume and Uniform CdZnTe and CdMnTe Detectors
Author :
Kim, K.H. ; Bolotnikov, A.E. ; Camarda, G.S. ; Tappero, R. ; Hossain, A. ; Cui, Y. ; Franc, J. ; Marchini, L. ; Zappettini, A. ; Fochuk, P. ; Yang, G. ; Gul, R. ; James, R.B.
Author_Institution :
Brookhaven National Laboratory, Upton, NY, USA
Volume :
59
Issue :
4
fYear :
2012
Firstpage :
1510
Lastpage :
1515
Abstract :
Although CdZnTe (CZT) and CdMnTe (CMT) materials are leading contenders for room-temperature semiconductor detectors, nonetheless, both materials have limitations hindering their full usage in producing economical, uniform, large-volume devices due to their grain/twin boundaries, material purity, secondary-phase Te defects and material segregation. We tried to prevent the generation of twin and subgrain boundaries to achieve large-volume CZT crystals by means of local temperature control between the CZT melt and quartz crucible. Also, we have expanded the understanding of the electrical and structural properties of coherent/incoherent twin boundaries. The high residual impurities in the starting source materials, especially in manganese, were identified as obstacles against obtaining high-performance CMT detectors. We found that purifying manganese telluride (MnTe) via a floating Te melt-zone very effectively removes impurities, leading to better detectors. CMT detectors fabricated with purified material give a 2.1% energy resolution for 662 keV with a ^{137} Cs gamma source without any electron-loss corrections. Secondary-phase Te defects deteriorate detector performance due to incomplete charge collection caused by charge trapping. In situ growth interface studies reveal the thermo-migration of Te inclusions to CZT melts and the dependence of Te-inclusion size on the cooling rate. The effective segregation coefficient of Zn in the CdTe host is nearly 1.3, so about 5%–6% of Zn deviation was reported in Bridgman-grown CZT (Zn ,= 10% ingots. Such uncontrolled Zn variations cause a significant variation of the band-gap throughout the ingot and, consequently, affect the nonuniformity of the detectors\´ responses. Practically, this means that manufacturers cannot cut the ingot parallel to the crystal growth direction. We also de- onstrated that the segregation of Zn can be controlled by creating particular thermal environments after growth.
Keywords :
Annealing; Cooling; Crystals; Detectors; Slabs; Zinc; II-VI semiconductor materials; X-ray detectors; cadmium compounds; gamma-ray detectors; semiconductor growth; semiconductor radiation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2202917
Filename :
6236261
Link To Document :
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