DocumentCode :
1555783
Title :
Material-based comparison for power heterojunction bipolar transistors
Author :
Gao, Guang-bo ; Morkoc, Hadis
Author_Institution :
Illinois Univ., Urbana, IL, USA
Volume :
38
Issue :
11
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
2410
Lastpage :
2416
Abstract :
Various materials are studied to determine their potential in power heterojunction bipolar transistors (HBTs). The authors first start by generating an HBT figure of merit (FOM) which is defined as the product of operating frequency and output power of the HBT with 3-dB power gain. By using the FOM and available material parameters, a material-based comparison of HBT performance is done. The general tendency is for use of narrow-bandgap materials, such as Ge or InGaAs, as the base and wide-bandgap materials, such as AlGaAs, InP, SiC, or GaN, as the collector, technology permitting
Keywords :
heterojunction bipolar transistors; power transistors; semiconductor device models; AlGaAs; GaN; Ge; HBT figure of merit; InGaAs; InP; SiC; material-based comparison; narrow-bandgap materials; operating frequency; output power; power heterojunction bipolar transistors; wide-bandgap materials; Bipolar transistors; Cutoff frequency; Electron emission; Electron mobility; Gallium arsenide; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Power generation; Silicon germanium;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.97401
Filename :
97401
Link To Document :
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