• DocumentCode
    1555795
  • Title

    A three dimensional semiconductor device simulator for GaAs/AlGaAs heterojunction bipolar transistor analysis

  • Author

    Chan, Hiang-Cheong ; Shieh, Tsay-Jiu

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
  • Volume
    38
  • Issue
    11
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    2427
  • Lastpage
    2432
  • Abstract
    A three-dimensional semiconductor device simulator was developed to study the steady-state characteristics of heterostructure compound semiconductor devices. The semiconductor partial differential equations-Poisson´s equation and the two carrier transport equations-are solved using finite-difference discretization. The Gummel iteration method and indirect space matrix solution techniques are utilized for minimizing computation time and memory requirements. This simulator was applied to the analysis of heterojunction bipolar transistors. The effect of emitter grading on the current-voltage characteristic is demonstrated. A comparison between two- and three-dimensional simulations is also presented. The results show that three-dimensional analysis is indispensable, in particular for devices of small geometry
  • Keywords
    III-V semiconductors; aluminium compounds; electronic engineering computing; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; GaAs-AlGaAs; Gummel iteration method; Poisson equation; carrier transport equations; current-voltage characteristic; emitter grading; finite-difference discretization; heterojunction bipolar transistor; indirect space matrix solution techniques; semiconductor partial differential equations; steady-state characteristics; three dimensional semiconductor device simulator; Analytical models; Computational modeling; Current-voltage characteristics; Differential equations; Finite difference methods; Gallium arsenide; Heterojunction bipolar transistors; Partial differential equations; Semiconductor devices; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.97405
  • Filename
    97405