DocumentCode :
1555912
Title :
Ion-cyclotron-resonance mass spectrometry with a microwave plasma source
Author :
Friedmann, James B. ; Shohet, J. Leon ; Wendt, Amy E.
Author_Institution :
Eng. Res. Center for Plasma-Aided Manuf., Wisconsin Univ., Madison, WI, USA
Volume :
19
Issue :
1
fYear :
1991
fDate :
2/1/1991 12:00:00 AM
Firstpage :
47
Lastpage :
51
Abstract :
The feasibility of coupling an electron-cyclotron-resonance (ECR) plasma-processing reactor directly to an omegatron mass spectrometer is demonstrated. The ECR plasma is created in a chamber that is coupled to the omegatron through a small, grounded orifice. Ions created in the ECR chamber flow along the magnetic field into the omegatron analysis cell, and the mass spectrum of these ions is recovered. Using this technique the mass spectra of both single-component (He) and two-component (N2 and N) ECR plasmas were measured. The mass resolution as a function of the omegatron excitation voltage for He and N2 plasmas was obtained and found to compare well to theoretical calculations
Keywords :
helium; mass spectroscopy; nitrogen; plasma applications; plasma diagnostics; plasma production; ECR plasma-processing reactor; He; N2; N2-N plasma; excitation voltage; ion-cyclotron-resonance mass spectrometry; mass resolution; microwave plasma source; omegatron mass spectrometer; Magnetic fields; Mass spectroscopy; Plasma applications; Plasma density; Plasma devices; Plasma diagnostics; Plasma materials processing; Plasma measurements; Plasma properties; Plasma sources;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.62366
Filename :
62366
Link To Document :
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