DocumentCode :
1555949
Title :
Low stress silver-glass die attach materials
Author :
Nguyen, My N.
Author_Institution :
Johnson Matthey Electron. Inc., San Diego, CA, USA
Volume :
13
Issue :
3
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
478
Lastpage :
483
Abstract :
The influence of sintering and rheological properties on the performance of silver-glass die attach materials is described. Improved silver-glass material has been developed. Stress relief for large-area dice gives void- and crack-free die bonding. This is achieved by controlling the sintering rate via additive technology. Precise rheology for high-speed dispensing in a tight cavity is possible by implementing the Y, E, and n rheological criteria in the manufacturing control. Single-pass firing with no predrying for large area dice (500 mils or larger) is possible
Keywords :
VLSI; borate glasses; integrated circuit technology; microassembling; silver; sintering; Ag-glass material; AgPbOB2O3; additive technology; crack-free die bonding; die attach materials; high-speed dispensing; large-area dice; manufacturing control; predrying; rheological properties; single-pass firing; sintering; void-free bonding; Additives; Bonding; Ceramics; Firing; Glass; Microassembly; Packaging; Rheology; Silver; Stress;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.58848
Filename :
58848
Link To Document :
بازگشت