DocumentCode :
1556201
Title :
Determining ideal impulse generator settings from a generator-transformer circuit model
Author :
Del Vecchio, Robert M. ; Ahuja, Rajendra ; Frenette, Robert Dean
Author_Institution :
Waukesha Electr. Syst., Milpitas, CA, USA
Volume :
17
Issue :
1
fYear :
2002
fDate :
1/1/2002 12:00:00 AM
Firstpage :
142
Lastpage :
148
Abstract :
Impulse testing of large power transformers is a routine test, which is designed to mimic a lightning strike in service. At the design stage, it is useful to have a detailed circuit model of the transformer in order to simulate the impulse test and to check for possibly damaging voltage stress levels. In the authors´ model, which includes capacitive and inductive couplings, as well as resistive effects, they apply an ideal full or chopped waveform to the impulsed terminal. In an actual impulse test, it is sometimes difficult to approximate the ideal waveform, particularly the full-wave one, and a trial-and-error approach is often taken. Here, they describe an approach that couples a circuit model of the impulse generator with a transformer circuit model and show how, from this combination, they can arrive at close to ideal settings for the generator, provided such settings are possible
Keywords :
impulse testing; insulation testing; power transformer insulation; power transformer testing; pulse generators; pulsed power supplies; Marx generator; capacitive couplings; circuit model; damaging voltage stress levels; generator-transformer circuit model; ideal impulse generator settings determination; impulse testing; inductive couplings; large power transformers; transformer circuit model; transformer dielectric tests; trial-and-error approach; waveform; Capacitors; Circuit simulation; Circuit testing; Coupling circuits; Impulse testing; Lightning; Power generation; Power transformers; Resistors; Tail;
fLanguage :
English
Journal_Title :
Power Delivery, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8977
Type :
jour
DOI :
10.1109/61.974201
Filename :
974201
Link To Document :
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