DocumentCode :
1556343
Title :
Semiconductor dynamic aperture for near-field terahertz wave imaging
Author :
Chen, Q. ; Zhang, X.-C.
Author_Institution :
Dept. of Physics, Appl. Phys. & Astron., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
7
Issue :
4
fYear :
2001
Firstpage :
608
Lastpage :
614
Abstract :
We describe and discuss near-field terahertz wave imaging with a dynamic aperture created on a semiconductor wafer. The spatial resolution of a near-field terahertz wave imaging system with a dynamic aperture created on a GaAs wafer is determined by the diameter of the gating-beam-induced thin photocarrier layer. With a dynamic aperture created on a GaAs wafer, we have achieved a subwavelength spatial resolution of ~λ/10. In addition, near-field terahertz wave imaging with a dynamic aperture overcomes the limitations in the reported methods of near-field terahertz wave imaging. Particularly, it is free of the high-pass filtering effect. Various terahertz images are presented to show the possible applications
Keywords :
III-V semiconductors; electro-optical effects; gallium arsenide; optical pulse generation; scanning probe microscopy; submillimetre wave imaging; GaAs; GaAs wafer; dynamic aperture; electrooptic sampling; gating-beam-induced thin photocarrier layer; high-pass filtering effect; near-field microscopy; near-field terahertz wave imaging; near-field terahertz wave imaging system; semiconductor dynamic aperture; semiconductor wafer; spatial resolution; Apertures; Biomedical imaging; Gallium arsenide; Optical beams; Optical filters; Optical imaging; Optical pumping; Optical saturation; Optical waveguides; Spatial resolution;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.974232
Filename :
974232
Link To Document :
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