DocumentCode :
1556374
Title :
Si-TaSi2 composite photodiodes with wavelength-independent quantum efficiency
Author :
Levinson, M. ; Schlafer, J. ; Ditchek, B.M.
Author_Institution :
GTE Lab. Inc., Waltham, MA, USA
Volume :
38
Issue :
11
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
2563
Lastpage :
2565
Abstract :
Photodiodes have been demonstrated which utilize the grown-in Schottky junctions of Si-TaSi2 eutectic composite material to give wavelength-independent quantum efficiencies of more than 80% (corrected for reflection loss) over nearly the entire visible and near-infrared portions of the spectrum. Noise measurements show a 1/f component which produces less than 10-dB excess noise-equivalent power relative to the shot noise limit at frequencies above 800 Hz. The good quality of these devices, together with their constant quantum efficiency over a wide range of wavelength, makes them of interest for further development in many photodetector applications
Keywords :
Schottky-barrier diodes; electron device noise; elemental semiconductors; photodiodes; silicon; tantalum compounds; 1/f noise component; Si-TaSi2 eutectic composite; grown-in Schottky junctions; photodetector applications; photodiodes; shot noise limit; wavelength-independent quantum efficiency; Composite materials; Noise measurement; Photodetectors; Photodiodes; Schottky barriers; Schottky diodes; Semiconductor device noise; Semiconductor diodes; Transmission line matrix methods; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.97424
Filename :
97424
Link To Document :
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