Efficient Parametric Characterization of the Dynamic Performance of an RFID IC

Author

Capdevila, S. ; Jofre, L. ; Romeu, Jordi ; Bolomey, J. Ch

Author_Institution

Signal Theor. & Commun. Dept., Univ. Politec. de Catalunya, Barcelona, Spain

Volume

22

Issue

8

fYear

2012

Firstpage

436

Lastpage

438

Abstract

In this letter, a measurement technique for a complete parametric characterization of the input impedance of an RFID IC is presented. The use of an SPDT switch to modulate the signal from the network analyzer provides the capability to measure the RFID IC activation level and its input impedance simultaneously. This data can then be used to fully predict the dynamic response and performance of an RFID tag.

Keywords

electric impedance measurement; modulation; radiofrequency identification; switches; RFID IC activation level measurement; RFID tag; dynamic performance; dynamic response prediction; input impedance measurement; network analyzer; parametric characterization; signal modulation; single pole double throw switch; Antennas; Impedance; Impedance measurement; Integrated circuits; Modulation; Power measurement; Radiofrequency identification; Characterization; input impedance; modulated scattering technique (MST); radio frequency identification (RFID); single pole double throw (SPDT);

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2012.2205910

Filename

6237551