DocumentCode :
1556401
Title :
Efficient Parametric Characterization of the Dynamic Performance of an RFID IC
Author :
Capdevila, S. ; Jofre, L. ; Romeu, Jordi ; Bolomey, J. Ch
Author_Institution :
Signal Theor. & Commun. Dept., Univ. Politec. de Catalunya, Barcelona, Spain
Volume :
22
Issue :
8
fYear :
2012
Firstpage :
436
Lastpage :
438
Abstract :
In this letter, a measurement technique for a complete parametric characterization of the input impedance of an RFID IC is presented. The use of an SPDT switch to modulate the signal from the network analyzer provides the capability to measure the RFID IC activation level and its input impedance simultaneously. This data can then be used to fully predict the dynamic response and performance of an RFID tag.
Keywords :
electric impedance measurement; modulation; radiofrequency identification; switches; RFID IC activation level measurement; RFID tag; dynamic performance; dynamic response prediction; input impedance measurement; network analyzer; parametric characterization; signal modulation; single pole double throw switch; Antennas; Impedance; Impedance measurement; Integrated circuits; Modulation; Power measurement; Radiofrequency identification; Characterization; input impedance; modulated scattering technique (MST); radio frequency identification (RFID); single pole double throw (SPDT);
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2012.2205910
Filename :
6237551
Link To Document :
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