DocumentCode :
1556504
Title :
A model-fitting approach to cluster validation with application to stochastic model-based image segmentation
Author :
Zhang, J. ; Modestino, J.W.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
12
Issue :
10
fYear :
1990
fDate :
10/1/1990 12:00:00 AM
Firstpage :
1009
Lastpage :
1017
Abstract :
A clustering scheme is used for model parameter estimation. Most of the existing clustering procedures require prior knowledge of the number of classes, which is often, as in unsupervised image segmentation, unavailable and must be estimated. This problem is known as the cluster validation problem. For unsupervised image segmentation the solution of this problem directly affects the quality of the segmentation. A model-fitting approach to the cluster validation problem based on Akaike´s information criterion is proposed, and its efficacy and robustness are demonstrated through experimental results for synthetic mixture data and image data
Keywords :
parameter estimation; pattern recognition; Akaike´s information criterion; cluster validation; image data; model-fitting; parameter estimation; pattern recognition; stochastic model-based image segmentation; synthetic mixture data; Biological system modeling; Clustering algorithms; Computer vision; Image segmentation; Layout; Pattern recognition; Robustness; Stochastic processes; Systems engineering and theory; Testing;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.58873
Filename :
58873
Link To Document :
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