Title :
Effects of Prestrain Applied to a Polyethylene Terephthalate Substrate Before the Coating of Al-Doped ZnO Film on Film Quality, Electrical Properties, and Pop-In Behavior During Nanoindentation
Author :
Li, Tse-Chang ; Han, Chang-Fu ; Wu, Bo-Hsiung ; Hsieh, Po-Tsung ; Lin, Jen-Fin
Author_Institution :
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
Four kinds of polyethylene-terephthalate (PET)/Al-doped zinc oxide (AZO) specimen are prepared to examine the effects of prestrain applied to the PET substrate before the coating of the AZO film on the mechanical, material, and electrical properties, and the start of pop-in in the loading phase of nanoindentation. The electrical contact resistance function is used to measure the variations of electrical current during the nanoindentation process. With the aid of the stress-strain profile, the inflection point of the load-depth profile in the loading phase is identified as the start of pop-in, at or nearby which the electrical current sharply increases due to the significant increase in the indenter-film contact area. The pop-in depth decreases with increasing prestrain. The behavior demonstrated in the pop-in depth due to the change in the prestrain is exactly opposite to those of the quantity and the mean size of submicrometer voids/cracks. Increase in the quantity/size of film voids/cracks generally reduces the specimen´s carrier mobility. The carrier mobility is presented to be inversely proportional to the sheet resistance. The electrical current created at the end of the loading process has its value inversely proportional to the number/size of film voids/cracks.
Keywords :
II-VI semiconductors; aluminium; carrier mobility; conducting polymers; contact resistance; electrical contacts; electrical resistivity; nanoindentation; semiconductor growth; semiconductor thin films; sputter deposition; sputtered coatings; stress-strain relations; surface cracks; surface resistance; voids (solid); wide band gap semiconductors; zinc compounds; Al-doped ZnO film coating; RF magnetron sputtering; ZnO:Al; carrier mobility; electrical contact resistance function; electrical current; electrical properties; film quality; indenter-film contact area; load-depth profile; mechanical properties; nanoindentation; polyethylene terephthalate substrate; pop-in behavior; prestrain effects; sheet resistance; stress-strain profile; submicrometer voids-cracks; Coatings; Positron emission tomography; Sputtering; Strain; Substrates; Zinc oxide; Defects; ZnO; electrical contact resistance (ECR); pop-in; prestrain;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2012.2205135