DocumentCode :
1556779
Title :
Fault-tolerant rank order filtering for image enhancement
Author :
Kim, Jai-Hoon ; Kim, Sungsoo ; Lombardi, Fabrizio
Author_Institution :
Div. of Inf. & Comput. Eng., Ajou Univ., Suwon, South Korea
Volume :
45
Issue :
2
fYear :
1999
fDate :
5/1/1999 12:00:00 AM
Firstpage :
436
Lastpage :
442
Abstract :
This paper presents an approach for the fault-tolerant computation of the rank order filtering on a SIMD (single instruction multiple data) mesh processor. The proposed approach improves over a previous approach in two respects: by changing the data dependency in the execution of the rank order filtering, a new algorithm with constant execution time complexity can be designed; and by introducing a dependency for the rank values of faulty processing elements (PEs) as computed by neighboring (fault free) PEs, a lower distortion can be achieved for the image enhancement. An algorithm is presented; this algorithm is based on a two-phase technique in which the rank corresponding to each faulty PE is computed by a selected fault free PE. The effect of the rank computation for a faulty PE is restricted within a window of the image, such that no significant overhead is accounted for in execution complexity. This results in a considerable improvement in speed-up ratio, fault-tolerance as well as a lower distortion in the reconstructed image. The proposed approach is also evaluated using experimental results. As the proposed algorithm is directly compatible with a SIMD mesh execution, a discussion of the communication constructs and switching architecture to support array processing is also presented
Keywords :
computational complexity; digital filters; fault tolerance; image enhancement; image reconstruction; nonlinear filters; parallel algorithms; parallel architectures; SIMD mesh execution; SIMD processor; array processing; communication construct; data dependency; distortion; fault-tolerant computation; fault-tolerant rank order filtering; faulty processing elements; image enhancement; rank computation; reconstructed image; single instruction multiple data; speed-up ratio; switching architecture; time complexity; two-phase technique; Algorithm design and analysis; Array signal processing; Circuit faults; Digital filters; Digital images; Fault tolerance; Filtering algorithms; Image enhancement; Image processing; Signal processing algorithms;
fLanguage :
English
Journal_Title :
Consumer Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-3063
Type :
jour
DOI :
10.1109/30.793429
Filename :
793429
Link To Document :
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