DocumentCode :
1556816
Title :
Two-Dimensional Dispersive Off-Chip Beam Scanner Fabricated on Silicon-On-Insulator
Author :
Van Acoleyen, Karel ; Bogaerts, Wim ; Baets, Roel
Author_Institution :
Dept. of Inf. Technol., Ghent Univ. - imec, Ghent, Belgium
Volume :
23
Issue :
17
fYear :
2011
Firstpage :
1270
Lastpage :
1272
Abstract :
One of the key elements in optical wireless applications such as laser scanning and writing is beam steering. While beam steering can be done actively using mirrors or liquid crystals, we have taken a passive approach to steer a beam in two dimensions by wavelength tuning. Therefore, we have fabricated an integrated two-dimensional beam steerer using silicon-on-insulator. The beam width is around 4.0° and can be steered in a range of 15°×50° for a wavelength shift of 100 nm. The beam width and range can be further optimized by changing the grating structure and size of the component.
Keywords :
beam steering; diffraction gratings; integrated optics; optical dispersion; optical fabrication; optical waveguides; silicon-on-insulator; spectral line shift; Si-SiO2; grating structure; integrated two-dimensional beam steerer; optical fabrication; silicon-on-insulator; two-dimensional dispersive off-chip beam scanner; waveguides; wavelength shift; Arrayed waveguide gratings; Couplers; Dispersion; Gratings; Photonics; Wavelength measurement; Beam steering; demultiplexing; grating couplers; silicon-on-insulator (SOI);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2159785
Filename :
5887390
Link To Document :
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