DocumentCode
1556816
Title
Two-Dimensional Dispersive Off-Chip Beam Scanner Fabricated on Silicon-On-Insulator
Author
Van Acoleyen, Karel ; Bogaerts, Wim ; Baets, Roel
Author_Institution
Dept. of Inf. Technol., Ghent Univ. - imec, Ghent, Belgium
Volume
23
Issue
17
fYear
2011
Firstpage
1270
Lastpage
1272
Abstract
One of the key elements in optical wireless applications such as laser scanning and writing is beam steering. While beam steering can be done actively using mirrors or liquid crystals, we have taken a passive approach to steer a beam in two dimensions by wavelength tuning. Therefore, we have fabricated an integrated two-dimensional beam steerer using silicon-on-insulator. The beam width is around 4.0° and can be steered in a range of 15°×50° for a wavelength shift of 100 nm. The beam width and range can be further optimized by changing the grating structure and size of the component.
Keywords
beam steering; diffraction gratings; integrated optics; optical dispersion; optical fabrication; optical waveguides; silicon-on-insulator; spectral line shift; Si-SiO2; grating structure; integrated two-dimensional beam steerer; optical fabrication; silicon-on-insulator; two-dimensional dispersive off-chip beam scanner; waveguides; wavelength shift; Arrayed waveguide gratings; Couplers; Dispersion; Gratings; Photonics; Wavelength measurement; Beam steering; demultiplexing; grating couplers; silicon-on-insulator (SOI);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2011.2159785
Filename
5887390
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