• DocumentCode
    1556818
  • Title

    Fast Full-Wave Solution That Eliminates the Low-Frequency Breakdown Problem in a Reduced System of Order One

  • Author

    Zhu, Jianfang ; Jiao, Dan

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    2
  • Issue
    11
  • fYear
    2012
  • Firstpage
    1871
  • Lastpage
    1881
  • Abstract
    Full-wave solutions of Maxwell´s equations break down at low frequencies. Existing methods for solving this problem either are inaccurate or incur additional computational cost. In this paper, a fast full-wave finite-element-based solution is developed to eliminate the low-frequency breakdown problem in a reduced system of order one. It is applicable to general 3-D problems involving ideal conductors as well as nonideal conductors immersed in inhomogeneous, lossless, lossy, and dispersive materials. The proposed method retains the rigor of a theoretically rigorous full-wave solution recently developed for solving the low-frequency breakdown problem, while eliminating the need for an eigenvalue solution. Instead of introducing additional computational cost to fix the low-frequency breakdown problem, the proposed method significantly speeds up the low-frequency computation.
  • Keywords
    Maxwell equations; computational electromagnetics; conductors (electric); eigenvalues and eigenfunctions; finite element analysis; reduced order systems; Maxwell equation breakdown; dispersive materials; eigenvalue solution; electromagnetic analysis; fast full-wave finite-element-based solution; general 3D problems; ideal conductors; low-frequency breakdown problem; nonideal conductors; reduced order system; Accuracy; Conductors; Dielectric losses; Eigenvalues and eigenfunctions; Electric breakdown; Resonant frequency; Vectors; Electromagnetic analysis; fast solution; finite element methods; full-wave analysis; low-frequency breakdown; nullspace;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2012.2203135
  • Filename
    6238314