Title :
A genetic algorithm based method for source identification and far-field radiated emissions prediction from near-field measurements for PCB characterization
Author :
Regué, Joan-Ramon ; Ribó, Miquel ; Garrell, Josep-Maria ; Martín, Antonio
Author_Institution :
Dept. of Commun. & Signal Theor., Ramon Llul Univ., Barcelona, Spain
fDate :
11/1/2001 12:00:00 AM
Abstract :
A new method for predicting the far-field radiated emissions and for finding the radiation sources of a device from near-field measurements is presented. It is based on the substitution of the original device by an equivalent set of elemental dipoles, placed over the main radiating sources, which radiate the same near-field (and therefore, far-field). This equivalent set of elemental dipoles is generated using a genetic algorithm. From the position and type of the equivalent elemental dipoles, the position of the actual radiating sources is determined. Since the field produced by an elemental dipole is known, the far-field radiation of the actual radiating source can be calculated. The new method has been tested using synthetic data and real measurements from the radiation generated by a modem PCB demonstrating its viability and usefulness
Keywords :
electric field measurement; electromagnetic compatibility; electromagnetic fields; electromagnetic interference; genetic algorithms; magnetic field measurement; modems; printed circuit testing; EMC regulations; EMI; elemental dipoles; far-field radiated emissions prediction; genetic algorithm; modem PCB; near-field measurements; near-field radiation; radiation sources; source identification; synthetic data; Antenna measurements; Electric variables measurement; Electromagnetic compatibility; Electromagnetic measurements; Genetic algorithms; Inverse problems; Near-field radiation pattern; Open area test sites; Performance evaluation; Testing;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on