• DocumentCode
    1557359
  • Title

    The effect of test system impedance on measurements of ground bounce in printed circuit boards

  • Author

    Wu, Tzong-Lin ; Lin, Yen-Hui ; Hwang, Jiuun-Nan ; Lin, Jig-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    43
  • Issue
    4
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    600
  • Lastpage
    607
  • Abstract
    Based on the 3D-FDTD approach, an efficient equivalent model employing the embedded resistive voltage source is proposed to simulate the effect of test system impedance on the measurement of the ground bounce noise for the power planes structure in the printed circuit boards (PCB). Compared with the measured results by vector network analyzer, this equivalent model well predicts the impedance behavior of the Vcc/GND power planes. The influences of different probe loading conditions of the test system on the measurement of impedance behavior are studied. It is found that the effects of the probing loads on the measurement of the ground bounce noise is significant at the frequencies near the dc point and resonance, but the influences of the probes are small at the frequencies far from resonance. In addition, the transfer characteristics of the power bus in the realistic digital circuits with decoupling capacitance being considered are simulated in the FDTD model. The difference of the transfer behavior between the realistic case without coaxial feed and the measured results with probing effects is also numerically compared. We find that the ground bounce noise in the real circuit can be accurately measured at most frequencies, where the power planes act in very low impedance, except at the frequencies near dc and resonance frequencies, where the power planes behave in relatively higher impedance characteristics
  • Keywords
    circuit noise; digital circuits; electric impedance; finite difference time-domain analysis; power supply circuits; printed circuit testing; 3D-FDTD approach; PCB; dc frequencies; decoupling capacitance; embedded resistive voltage source; equivalent model; ground bounce; ground bounce noise; power bus; power planes structure; printed circuit boards; probe loading conditions; realistic digital circuits; resonance frequencies; test system impedance; transfer characteristics; Circuit noise; Circuit simulation; Circuit testing; Frequency; Impedance measurement; Noise measurement; Power measurement; Power system modeling; Resonance; System testing;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.974640
  • Filename
    974640