Measurement of integrated circuit conducted emissions by using a transverse electromagnetic mode (TEM) cell

Author

Fiori, Franco ; Musolino, Francesco

Author_Institution

Dipt. di Elettronica, Politecnico di Torino, Italy

Volume

43

Issue

4

fYear

2001

fDate

11/1/2001 12:00:00 AM

Firstpage

622

Lastpage

628

Abstract

This paper presents a new technique for the measurement of integrated circuit (IC) conducted emissions. In particular, the spectrum of interfering current flowing through an IC port is detected by using a transverse electromagnetic mode (TEM) cell. A structure composed of a microstrip line inserted in a matched TEM cell is considered. The structure is excited by an interfering source connected to one end of the transmission line. The relationship between the current spectrum of the source and the spectrum of the RF power delivered to the TEM mode of the cell is derived. This relationship is evaluated for one specific structure and the experimental validation is shown. Results of conducted emission measurement performed by using such a technique are shown as well and compared with those derived by using the magnetic probe method

Keywords

electromagnetic compatibility; electromagnetic interference; integrated circuit testing; microstrip lines; probes; test facilities; EMC; EMI; IC conducted emission measurement; IC port; PCB; RF power spectrum; TEM cell; integrated circuit; interfering current spectrum; interfering source; magnetic probe method; matched TEM cell; microstrip line; transmission line; transverse electromagnetic mode cell; Electromagnetic compatibility; Electromagnetic measurements; Integrated circuit measurements; Magnetic field measurement; Pins; Power supplies; Probes; Pulse measurements; Pulsed power supplies; Tellurium;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.974643

Filename

974643