Wideband frequency-domain characterization of FR-4 and time-domain causality

Author

Djordjevic A.R. ; Biljie, R.M. ; Likar-Smiljanic, V.D. ; Sarkar, T.K.

Author_Institution

Sch. of Electr. Eng., Belgrade Univ., Serbia

Volume

43

Issue

4

fYear

2001

Firstpage

662

Lastpage

667

Abstract

FR-4 is one of the most widely used dielectric substrates in the fabrication of printed circuits for fast digital devices. This material exhibits substantial losses and the loss tangent is practically constant over a wide band of frequencies. This paper presents measured data for the complex permittivity of this material from power frequencies up to the microwave region. In addition it gives simple closed-form expressions that approximate the measured data and provide a causal response in the time domain.

Keywords

dielectric loss measurement; dielectric materials; permittivity measurement; printed circuit manufacture; rational functions; time-domain analysis; FR-4; bilinear function; closed-form expressions; complex permittivity; dielectric losses; dielectric measurements; dielectric substrates; fast digital devices; first-order polynomials; logarithm; loss tangent; measured data approximation; microwave region; multilayered boards; power frequencies; printed circuits fabrication; rational functions; relative complex permittivity; time domain causal response; time-domain causality; wideband frequency-domain characterization; Printed circuit fabrication;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/15.974647

Filename

974647