Title :
Increasing EMI Immunity in Novel Low-Voltage CMOS OpAmps
Author_Institution :
Dept. of Electron., Univ. of Brescia, Brescia, Italy
Abstract :
An easy solution to increase the immunity to electromagnetic interferences in recent low-voltage CMOS amplifiers is presented. It is based on a simple modification of the input stage, which can be fabricated in standard CMOS technologies and does not require extra mask levels, such as triple well, nor external components. Analysis and results are provided for very large interferences, arising from the input pin.
Keywords :
CMOS analogue integrated circuits; electromagnetic interference; operational amplifiers; EMI immunity; electromagnetic interference; novel low-voltage CMOS OpAmp; standard CMOS technology; CMOS integrated circuits; CMOS technology; Electromagnetic interference; Electromagnetics; Standards; Topology; Transistors; CMOS; immunity to electromagnetic interferences; integrated circuits; operational amplifier;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2012.2206815
