• DocumentCode
    1557477
  • Title

    Optical Properties of A-Plane InGaN/GaN Multiple Quantum Wells Grown on Nanorod Lateral Overgrowth Templates

  • Author

    Huang, Huei-Min ; Ling, Shih-Chun ; Chan, Wei-Wen ; Lu, Tien-Chang ; Kuo, Hao-Chung ; Wang, Shing-Chung

  • Author_Institution
    Dept. of Photonics & Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    47
  • Issue
    8
  • fYear
    2011
  • Firstpage
    1101
  • Lastpage
    1106
  • Abstract
    A-plane InGaN/GaN multiple-quantum wells (MQWs) were grown on a series of nanorod epitaxial lateral overgrowth (NRELOG) templates with varied nanorod depth. Optical properties of these samples were investigated by excitation power and temperature-dependent photoluminescence (PL). Due to the absence of quantum-confined Stark effect, the negligible PL emission peak shift and nearly identical power index for all samples were observed. In contrast to the as-grown MQWs, the thermal activation energy and internal quantum efficiency of NRELOG MQWs exhibit 1.6-fold and 4-fold increases, respectively, which are attributed to the improvement of crystal quality by NRELOG. Furthermore, the Shockley-Read-Hall nonradiative coefficient, determined from the fits of power-dependent PL quantum efficiency, is also apparently reduced while MQWs are grown on NRELOG GaN template. The results show the feasibility to fabricate high radiative efficiency a-plane devices via NRELOG.
  • Keywords
    III-V semiconductors; Stark effect; epitaxial growth; gallium compounds; indium compounds; photoluminescence; semiconductor growth; semiconductor quantum wells; wide band gap semiconductors; A-plane multiple quantum wells; InGaN-GaN; Shockley-Read-Hall nonradiative coefficient; Stark effect; excitation power; nanorod epitaxial lateral overgrowth templates; optical properties; temperature-dependent photoluminescence; thermal activation energy; Epitaxial growth; Etching; Gallium nitride; Light emitting diodes; Quantum well devices; Radiative recombination; Temperature measurement; A-plane; InGaN/GaN multiple quantum wells; internal quantum efficiency; nanorod lateral epitaxial overgrowth;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2011.2158632
  • Filename
    5892865