CMOS APS MTF modeling

Author

Shcherback, Igor ; Yadid-Pecht, Orly

Author_Institution

Dept. of Electr. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel

Volume

48

Issue

12

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

2710

Lastpage

2715

Abstract

In this paper, a unified model, based on a thorough analysis of experimental data, is developed for the overall modulation transfer function (MTF) estimation for CMOS image sensors. The model covers the physical diffusion effect together with the influence of the pixel active area geometrical shape. Comparison of both our predicted results and the MTF calculated from the point spread function (PSF) measurements of an actual pixel array gives excellent agreement. This confirms the hypothesis that the active area shape together with the photocarrier diffusion effect are the determining factors of the overall CMOS active pixel sensor (APS) MTF behavior, and allows us to extract the minority-carrier diffusion length. The results indicate that for any potential active area shape, a reliable estimate of image performance is possible, so the tradeoff between the conflicting requirements, such as signal-to-noise ratio (SNR) and MTF could be compared per pixel design

Keywords

CMOS image sensors; carrier lifetime; integrated circuit modelling; integrated circuit noise; minority carriers; optical transfer function; parameter estimation; CMOS APS MTF modeling; CMOS active pixel sensor; CMOS image sensors; MTF estimation; SNR; minority carrier diffusion length; modulation transfer function; parameter estimation; photocarrier diffusion effect; physical diffusion effect; pixel active area geometrical shape; pixel array; point spread function measurements; signal-to-noise ratio; unified model; Active shape model; CMOS image sensors; Data analysis; Image analysis; Pixel; Semiconductor device modeling; Signal design; Signal to noise ratio; Solid modeling; Transfer functions;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.974694

Filename

974694