DocumentCode :
1557643
Title :
Unified Architecture for Reed-Solomon Decoder Combined With Burst-Error Correction
Author :
Li, Li ; Yuan, Bo ; Wang, Zhongfeng ; Sha, Jin ; Pan, Hongbing ; Zheng, Weishan
Author_Institution :
Inst. of VLSI Design, Nanjing Univ., Nanjing, China
Volume :
20
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
1346
Lastpage :
1350
Abstract :
Reed-Solomon (RS) codes are widely used as forward correction codes (FEC) in digital communication and storage systems. Correcting random errors of RS codes have been extensively studied in both academia and industry. However, for burst-error correction, the research is still quite limited due to its ultra high computation complexity. In this brief, starting from a recent theoretical work, a low-complexity reformulated inversionless burst-error correcting (RiBC) algorithm is developed for practical applications. Then, based on the proposed algorithm, a unified VLSI architecture that is capable of correcting burst errors, as well as random errors and erasures, is firstly presented for multi-mode decoding requirements. This new architecture is denoted as unified hybrid decoding (UHD) architecture. It will be shown that, being the first RS decoder owning enhanced burst-error correcting capability, it can achieve significantly improved error correcting capability than traditional hard-decision decoding (HDD) design.
Keywords :
Reed-Solomon codes; VLSI; decoding; error correction codes; Reed-Solomon codes; Reed-Solomon decoder; VLSI architecture; burst-error correction; digital communication; forward correction codes; hard-decision decoding design; low-complexity reformulated inversionless burst-error correcting algorithm; multimode decoding; storage systems; unified architecture; unified hybrid decoding architecture; Computer architecture; Decoding; Hardware; Polynomials; Reed-Solomon codes; Registers; Very large scale integration; Burst errors; Reed-Solomon (RS) codes; VLSI; unified architecture;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2154369
Filename :
5892920
Link To Document :
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