DocumentCode
1557833
Title
An educational perspective on in-circuit testing
Author
Beaujean, D.A. ; Morgan, S.B.
Author_Institution
Dept. of Electr. & Electron. Eng., Polytech. of Wales, Pontypridd, UK
Volume
135
Issue
4
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
233
Lastpage
240
Abstract
The increasing use of CADMAT tools in the production environment presents a major challenge in personnel training. Electronics manufacturers introducing ATE are quickly made aware of the scarcity of test engineers experienced in using this equipment and of the need for rapid training to increase the pool of available talent. The authors give consideration to the ways in which ATE training might be implemented and an outline scheme is described for a three-day course on in-circuit testing
Keywords
automatic test equipment; educational courses; integrated circuit testing; printed circuit testing; training; ATE; CADMAT tools; IC testing; education; in-circuit testing; personnel training; three-day course;
fLanguage
English
Journal_Title
Physical Science, Measurement and Instrumentation, Management and Education - Reviews, IEE Proceedings A
Publisher
iet
ISSN
0143-702X
Type
jour
Filename
6240
Link To Document