Title :
Noise limits in reconstruction of optical parameters of silica-based double-layer planar waveguides on silicon
Author :
Kubica, Jacek M.
Author_Institution :
Fac. of Phys., Warsaw Univ. of Technol., Poland
fDate :
1/1/2002 12:00:00 AM
Abstract :
The paper presents a study on the reliability and limits of the downhill simplex algorithm used to reconstruct optical parameters of double-layer silica waveguides from the measured effective indexes. It provides a number of surface plots of the merit function and explains the behavior of the algorithm in practical situations where the measured effective index data are affected by noise
Keywords :
optical noise; optical planar waveguides; optical waveguide theory; refractive index; silicon compounds; Si; SiO2-Si; double-layer silica waveguides; downhill simplex algorithm; measured effective index data; measured effective indexes; merit function; noise; noise limits; optical parameters reconstruction; optical planar waveguides; reliability; silica-based double-layer planar waveguides; silicon; surface plots; Geometrical optics; Noise measurement; Optical devices; Optical noise; Optical planar waveguides; Optical refraction; Optical variables control; Optical waveguides; Planar waveguides; Silicon compounds;
Journal_Title :
Lightwave Technology, Journal of
