DocumentCode :
1557902
Title :
Planck satellite 70 GHz receiver noise tests
Author :
Sjöman, Pekka ; Ruokokoski, Teemu ; Jukkala, Petri ; Eskelinen, Pekka
Author_Institution :
Metsahovi Radio Res. Station, Helsinki Univ. of Technol., Finland
Volume :
16
Issue :
12
fYear :
2001
fDate :
12/1/2001 12:00:00 AM
Firstpage :
19
Lastpage :
23
Abstract :
The LFI (Low Frequency Instruments) receivers in the coming Planck satellite are of continuous comparison type and use low noise amplifiers based on high electron mobility transistors manufactured from indium phosphide substrate (INP-HEMT-MMIC-LNAs). This article describes the 1/f-noise tests and the associated test system for the 70 GHz demonstrator receiver, which can either use single or dual channel phase switcher methods. The 1/f knee frequency is shown to depend on the calculation method of the r-value. A minimum 1/f knee frequency around 10 mHz has been achieved with full two channel foxtrot and individually adopted r-values for each phase states while a straightforward single phase technology cannot go below 40 mHz
Keywords :
1/f noise; HEMT integrated circuits; MMIC amplifiers; field effect MIMIC; integrated circuit noise; millimetre wave amplifiers; millimetre wave receivers; space vehicle electronics; 1/f knee frequency; 1/f-noise tests; 70 GHz; Planck satellite; continuous comparison type; demonstrator receiver; dual channel phase switcher; flight model receiver; high electron mobility transistors; low frequency instruments receivers; low noise amplifiers; millimeter wave receivers; single channel phase switcher; Frequency; HEMTs; Instruments; Knee; Low-frequency noise; Low-noise amplifiers; MODFETs; Manufacturing; Satellites; System testing;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/62.974835
Filename :
974835
Link To Document :
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