Title :
Two-Way Relaying in Interference-Limited AF Cooperative Networks Over Nakagami-
Fading
Author :
Costa, Daniel Benevides da ; Ding, Haiyang ; Yacoub, Michel Daoud ; Ge, Jianhua
Author_Institution :
Fed. Univ. of Ceara, Sobral, Brazil
Abstract :
The performance of dual-hop amplify-and-forward (AF) two-way relaying systems with multiple cochannel interferers at the AF relay and two noisy end-sources is investigated. Assuming a Nakagami- m fading environment, closed-form approximate expressions for the outage probability, average error probability, and achievable sum rate are derived, yielding results which, in practice, are indistinguishable from the exact analysis. In addition, the derived approximate expressions are evaluated instantaneously, regardless of the number of interferers, highly contrasting with the intricacy and computational inefficiency inherent to the exact formulations, which requires the evaluation of nested multiple integrals, i.e., a problem that becomes computationally intractable as the number of interferers increases. Our analysis allows for general operating scenarios with distinct integer-value Nakagami- m fading parameters and unequal average fading power values between the hops. Monte Carlo simulation results are presented to corroborate the tightness of the proposed approximations.
Keywords :
Monte Carlo methods; Nakagami channels; amplify and forward communication; cooperative communication; error statistics; radiofrequency interference; AF relay; Monte Carlo simulation; average error probability; closed-form approximate expressions; integer-value Nakagami-m fading channel; interference-limited AF cooperative networks; multiple cochannel interferers; nested multiple integral evaluation; noisy end-sources; outage probability; two-way relaying; Approximation methods; Error probability; Fading; Interference; Monte Carlo methods; Noise measurement; Relays; Amplify-and-forward (AF); Nakagami-$m$ fading; interference-limited scenarios; performance analysis; two-way relaying;
Journal_Title :
Vehicular Technology, IEEE Transactions on
DOI :
10.1109/TVT.2012.2208773