• DocumentCode
    1558056
  • Title

    Impact of three-dimensional architectures on interconnects in gigascale integration

  • Author

    Joyner, James W. ; Venkatesan, Raguraman ; Zarkesh-Ha, Payman ; Davis, Jeffrey A. ; Meindl, James D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    9
  • Issue
    6
  • fYear
    2001
  • Firstpage
    922
  • Lastpage
    928
  • Abstract
    An interconnect distribution model for homogeneous, three-dimensional (3-D) architectures with variable separation of strata is presented. Three-dimensional architectures offer an opportunity to reduce the length of the longest interconnects. The separation of strata has little impact on the length of interconnects but a large impact on the number of interstratal interconnects. Using a multilevel interconnect methodology for an ITRS 2005 100 nm ASIC, a two-strata architecture offers a 3.9/spl times/ increase in wire-limited clock frequency, an 84% decrease in wire-limited area or a 25% decrease in the number of metal levels required. In practice, however, such fabrication advances as improved alignment tolerances in wafer-bonding techniques are needed to gain key advantages stemming from 3-D architectures for homogeneous gigascale integrated circuits.
  • Keywords
    VLSI; application specific integrated circuits; integrated circuit interconnections; integrated circuit layout; logic partitioning; multivalued logic circuits; ASIC; gigascale integration; homogeneous architecture; homogeneous logic blocks; improved alignment tolerances; interconnect distribution model; multilevel interconnect methodology; number of metal levels; three-dimensional architecture; two-strata architecture; variable separation of strata; wafer-bonding techniques; wire-limited area; wire-limited clock frequency; Application specific integrated circuits; Clocks; Fabrication; Frequency; Integrated circuit interconnections; Multilevel systems; Predictive models; Semiconductor device modeling; System analysis and design; Wiring;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.974905
  • Filename
    974905