• DocumentCode
    1558060
  • Title

    A stochastic model for the interconnection topology of digital circuits

  • Author

    Verplaetse, Peter ; Stroobandt, Dirk ; Van Campenhout, Jan

  • Author_Institution
    Dept. of Electron. & Inf. Syst., Ghent Univ., Belgium
  • Volume
    9
  • Issue
    6
  • fYear
    2001
  • Firstpage
    938
  • Lastpage
    942
  • Abstract
    Rent´s rule has been successfully applied to a priori estimation of wire length distributions. However, this approach is very restrictive: the circuits are assumed to be homogeneous. In this paper, recursive clustering is described as a more advanced model for the partitioning behavior of digital circuits. It is applied to predict the variance of the terminal count distribution. First, the impact of the block degree distribution is analyzed with a simple model. A more refined model incorporates the effect of stochastic self similarity. Finally, the model is further extended to describe the effects of heterogeneity. This model is a promising candidate for more accurate a priori estimation tools.
  • Keywords
    VLSI; digital integrated circuits; estimation theory; integrated circuit interconnections; integrated circuit modelling; logic partitioning; network topology; stochastic systems; Rent´s rule; digital circuits; interconnection topology; partitioning; recursive clustering; stochastic model; terminal count distribution; Circuit topology; Digital circuits; Helium; Integrated circuit interconnections; Logic circuits; Minimization; Recursive estimation; Statistics; Stochastic processes; Wire;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.974907
  • Filename
    974907