• DocumentCode
    1558223
  • Title

    Temporal evolution of electron beam transport in PASOTRON microwave sources

  • Author

    Bliokh, Yury P. ; Nusinovich, G.S.

  • Author_Institution
    Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    29
  • Issue
    6
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    951
  • Lastpage
    959
  • Abstract
    The plasma-assisted slow-wave oscillator (PASOTRON) is a high-power microwave source, in which the transport of an intense electron beam through an interaction region is based on the focusing effect of a beam generated plasma channel (Bennett pinch). A simple theory is developed which describes the self-consistent nonstationary processes of the plasma formation due to impact ionization of an axially inhomogeneous gas by the beam and the beam focusing effect of the plasma. The theory is illustrated by examples showing the temporal evolution of the beam transport in the process of plasma creation in PASOTRONs
  • Keywords
    beam handling equipment; electron beam focusing; electron beams; impact ionisation; microwave generation; microwave oscillators; microwave tubes; pinch effect; plasma production; plasma transport processes; plasma-beam interactions; slow wave structures; space charge; Bennett pinch; PASOTRON microwave sources; PASOTRONs; axially inhomogeneous gas; beam focusing effect; beam generated plasma channel; beam transport; electron beam transport; focusing effect; high-power microwave source; impact ionization; intense electron beam; interaction region; plasma; plasma creation; plasma formation; plasma-assisted slow-wave oscillator; self-consistent nonstationary processes; simple theory; temporal evolution; Electron beams; High power microwave generation; Impact ionization; Microwave generation; Microwave oscillators; Particle beams; Plasma confinement; Plasma density; Plasma sources; Plasma transport processes;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.974984
  • Filename
    974984