Title :
High-resolution OCDR for testing integrated-optical waveguides: dispersion-corrupted experimental data corrected by a numerical algorithm
Author :
Kohlhaas, Andreas ; FrÖmchen, Carsten ; Brinkmeyer, Ernst
Author_Institution :
Tech. Univ. Hamburg, Germany
fDate :
11/1/1991 12:00:00 AM
Abstract :
A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric (OCDR) measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range. High-resolution OCDR measurements may be seriously impaired by dispersion effects in the waveguides under test and rugged source spectra. In the investigation (Ti:LiNbO3 single-mode waveguide, 16 mm long; superluminescent diode source at λ0=820 nm) the spatial resolution progressively deteriorates along the waveguide by about one order of magnitude (from 6 to 60 μm). The algorithm was applied to the experimental data and successfully removed the dispersive broadening of the signatures
Keywords :
integrated optics; optical dispersion; optical testing; optical waveguides; reflectometry; LiNbO3:Ti single mode waveguide; dispersion-corrupted experimental data; dispersive broadening; enhanced dynamic range; integrated-optical waveguides; micrometer resolution; numerical algorithm; optical coherence domain reflectometry; signatures; spatial resolution; superluminescent diode source; Dispersion; Mirrors; Optical interferometry; Optical noise; Optical reflection; Optical sensors; Optical signal processing; Optical waveguides; Spatial resolution; Testing;
Journal_Title :
Lightwave Technology, Journal of
