Title :
Sensitivity of Rs-measurement of HTS thin films by three prime resonant techniques: cavity resonator, dielectric resonator, and microstrip resonator
Author :
Misra, Mukul ; Kataria, Narayan D. ; Pinto, R. ; Tonouchi, Masayoshi ; Srivastava, G.P.
Author_Institution :
Res. Center for Supercond. Photonics, Osaka Univ., Japan
fDate :
12/1/2001 12:00:00 AM
Abstract :
The microwave surface resistance, Rs measurement of YBa 2Cu307 -δ (YBCO) thin film deposited on 10 mm × 10 mm LaAlO3 substrate using three prime resonating techniques, namely, cavity end plate substitution technique (20 GHz), dielectric resonator technique (18 GHz), and microstrip resonator technique (5 GHz), is reported. In addition, theoretical analysis for each technique has been performed to calculate the relative percentage error in the measured Rs -value of the YBCO thin film as a function of temperature. It has been found that the shielded dielectric resonator provides far better sensitivity for R.-measurement of the YBCO thin film with minimum relative percentage error (<4%) in the temperature range from 20 K to transition temperature of YBCO thin film compared to the other two techniques
Keywords :
barium compounds; cavity resonators; dielectric resonators; high-temperature superconductors; measurement errors; microstrip resonators; microwave measurement; superconducting microwave devices; superconducting resonators; superconducting thin films; yttrium compounds; 10 mm; 18 GHz; 20 GHz; 20 K; 5 GHz; HTS thin films; LaAlO3; Rs-value; YBa2Cu3O7-δ-LaAlO3 ; YBa2Cu3O7-δ/LaAlO3 ; cavity end plate substitution; dielectric resonator technique; microstrip resonator technique; microwave surface resistance measurement; minimum relative percentage error; prime resonating techniques; shielded dielectric resonator; transition temperature; Dielectric substrates; Dielectric thin films; Electrical resistance measurement; Microwave measurements; Microwave theory and techniques; Sputtering; Surface resistance; Temperature distribution; Temperature sensors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
