DocumentCode :
1559692
Title :
Self-heating effects in red (665 nm) VCSELs
Author :
Knowles, Gerry ; Sweeney, S.J. ; Adams, A.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Laval Univ., Qubec, Canada
Volume :
148
Issue :
56
fYear :
2001
Firstpage :
256
Lastpage :
260
Abstract :
The threshold current (Ith) of GaInP/AlGaInP based vertical cavity surface emitting lasers (VCSELs) is very sensitive to temperature. The extent to which self-heating in a compact VCSEL structure couples with temperature sensitive loss mechanisms is investigated. In particular, the authors consider the strong increase in threshold current (Ith) due to carrier leakage into the X-minima and gain-cavity detuning effects. They find, using two experimental methods and from a thermal model, that the current-induced increase of the active region temperature (ΔT) increases linearly with Ith at a rate of ~14.5 K mA-1 over a limited substrate temperature range. They estimate that the additional losses due to self-heating rise from 5% of the total Ith at room temperature (20°C) to 30% at 47°C. To uncouple the effects of leakage and gain-cavity alignment, they have calculated the gain spectra to find the radiative current as a function of temperature. They thus verify that leakage coupled to self-heating is the major cause of the increase in Ith in these devices at room temperature and above. Gain-cavity detuning has minimal effect on Ith due to the broad short wavelength tail of the quantum well gain spectrum
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; laser cavity resonators; laser tuning; optical losses; quantum well lasers; sensitivity; surface emitting lasers; thermo-optical effects; 20 C; 47 C; GaInP-AlGaInP; GaInP/AlGaInP based vertical cavity surface emitting lasers; VCSEL; active region temperature; carrier leakage; gain spectra; gain-cavity alignment; gain-cavity detuning; gain-cavity detuning effects; leakage coupled; quantum well gain spectrum; room temperature; self-heating; temperature sensitive loss mechanisms; thermal model; threshold current;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:20010843
Filename :
980752
Link To Document :
بازگشت