Author :
Randall, Mai ; Hock, T.
Author_Institution :
National Center for Atmospheric Research
Keywords :
Circuits; Frequency locked loops; Impedance; Microwave oscillators; Microwave theory and techniques; Resistors; Steady-state; Testing; Voltage;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2002.981273
