DocumentCode :
1560039
Title :
Photo-injection p-i-n diode switch for high-power RF switching
Author :
Jacobs, E.W. ; Fogliatti, D.W. ; Nguyen, H. ; Albares, D.J. ; Chang, C.T. ; Sun, C.K.
Author_Institution :
Space & Naval Warfare Syst. Center, San Diego, CA, USA
Volume :
50
Issue :
2
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
413
Lastpage :
419
Abstract :
The high RF power-switching properties of the photo-injection p-i-n switch (PIPINS), an optically controlled RF switch, are investigated. Proper functioning of a PIPINS as a low insertion-loss RF switch requires that it operates as a photoconductor, where the photo-injected charge is much greater than the RF sweep out charge. Insertion loss using 650-mW optical power was <0.4 dB at RF (VHF-UHF) power in excess of 200 W, and devices successfully standoff 200-W incident RF power with the series isolation being determined by the device capacitance (e.g., 225 fF). PIPINS hot-switching measurements are reported for the first time, with output RF power up to 180 W at low duty cycle, rise times of 1 ps, and fall times for a series shunt switch of ≈2.5 μs. The RF power for hot switching a PIPINS is limited by a latch-on effect, which is dependent on a variety of parameters, including duty cycle and repetition period, consistent with thermally generated carriers contributing to the latch-on effect. The switching properties of PIPINS make them a candidate for high RF power applications such as reconfigurable antennas, where electromagnetic isolation of the switch and control lines are critical
Keywords :
p-i-n photodiodes; photoconducting switches; power semiconductor switches; 0.4 dB; 1 ps; 180 to 200 W; 2.5 mus; 225 fF; 650 mW; VHF-UHF range; capacitance; duty cycle; electromagnetic isolation; fall time; high-power RF switching; hot switching; insertion loss; latch-on effect; optically controlled RF switch; photo-injection p-i-n diode switch; photoconductor; repetition period; rise time; series shunt switch; Capacitance; Insertion loss; Optical control; Optical devices; Optical losses; Optical switches; P-i-n diodes; PIN photodiodes; Photoconductivity; Radio frequency;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.982217
Filename :
982217
Link To Document :
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