DocumentCode :
1560159
Title :
Compact associative-memory architecture with fully parallel search capability for the minimum Hamming distance
Author :
Mattausch, Hans Jürgen ; Gyohten, Takayuki ; Soda, Yoshihiro ; Koide, Tetsushi
Author_Institution :
Res. Center for Nanodevices & Syst., Hiroshima Univ., Japan
Volume :
37
Issue :
2
fYear :
2002
fDate :
2/1/2002 12:00:00 AM
Firstpage :
218
Lastpage :
227
Abstract :
An associative-memory architecture for a fully parallel minimum Hamming distance search is proposed, which uses digital circuitry for bit comparison and fast analog circuitry for word comparison as well as winner-take-all (WTA) functionality. Following this original approach allows compact and high-performance integration in conventional CMOS technology. First, static encoding of word-comparison results as a current-sink capability reduces word-comparison circuitry to the theoretical minimum, namely, one transistor per bit and one signal line per word. Second, a new WTA principle, which we call self-adapting winner line-up amplification (WLA), regulates the winner row output automatically into the narrow maximum-gain region of a distance amplifier. Third, winner search circuit complexity scales linear with reference-word number and not quadratic as inevitable for digital approaches. Due to static distance encoding and WLA regulation, transient noise and fabrication process variations are largely tolerated. Only relative chip-internal transistor-parameter variations, creating effective mismatch of matched transistors, limit winner search result correctness. Practical feasibility is verified
Keywords :
CMOS memory circuits; Hamming codes; content-addressable storage; integrated circuit noise; mixed analogue-digital integrated circuits; CMOS; associative-memory architecture; bit comparison; current-sink capability; fabrication process variations; fully parallel search capability; maximum-gain region; minimum Hamming distance; self-adapting winner line-up amplification; transient noise; transistor-parameter variations; winner search circuit complexity; winner-take-all functionality; word comparison; Associative memory; CADCAM; CMOS technology; Circuit noise; Complexity theory; Computer aided manufacturing; Encoding; Fabrication; Hamming distance; Hardware;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.982428
Filename :
982428
Link To Document :
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