• DocumentCode
    1560274
  • Title

    Effect of temperature cycling on joint strength of PbSn and AuSn solders in laser packages

  • Author

    Kuang, Jao-Hwa ; Sheen, Maw-Tyan ; Chang, Chia-Fu H. ; Chen, Chai-Cheng ; Wang, Gow-Ling ; Cheng, Wood-Hi

  • Author_Institution
    Mech. Eng. Dept., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    24
  • Issue
    4
  • fYear
    2001
  • fDate
    11/1/2001 12:00:00 AM
  • Firstpage
    563
  • Lastpage
    568
  • Abstract
    The effect of temperature cycle testing on the joint strength of PbSn and AuSn solders in laser diode packages has been studied experimentally and numerically. Experimental results showed that the joint strength increased as the temperature cycle number increased initially, and then became steady after 400 cycles. The joint strengths of PbSn and AuSn solders increased about 40% to 20% after undergoing 500 temperature cycles, respectively. A finite-element method (FEM) analysis was performed on the calculation of joint strength variation of PbSn and AuSn solders in temperature cycling tests. The coupled thermal-elasticity-plasticity model was employed in the solidification and residual stresses calculation. Simulation results were in good agreement with the experimental measurements that the solder joint strength increased as the temperature cycle increased. Numerical results indicate that the increasing solder joint strength comes from the redistribution of the residual stresses within the solder during temperature cycling tests. The local yielding and the creep effects on the low melting temperature solders will make uniform the residual stresses distribution introduced in the solidification process and increasing the solder joint strength as the temperature cycle number increased. The result suggests that the FEM is an effective method for analyzing and predicting the solder joint strength in laser diode packages
  • Keywords
    creep; finite element analysis; gold alloys; internal stresses; lead alloys; mechanical strength; semiconductor device packaging; semiconductor device testing; semiconductor lasers; soldering; solidification; tin alloys; Au-Sn solders; AuSn; FEM analysis; LD packages; Pb-Sn solders; PbSn; coupled thermal-elasticity-plasticity model; creep effects; finite-element method; laser diode packages; local yielding; low melting temperature solders; residual stresses calculation; residual stresses distribution; solder joint strength; solidification calculation; strength variation; temperature cycle testing; Diode lasers; Finite element methods; Packaging; Performance analysis; Performance evaluation; Residual stresses; Soldering; Temperature distribution; Testing; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/6040.982845
  • Filename
    982845