DocumentCode
1560276
Title
Characterization of 63Sn37Pb and 80Au2OSn solder sealed optical fiber feedthroughs subjected to repetitive thermal cycling
Author
Beranek, M.W. ; Rassaian, M. ; Tang, C.H. ; St John, C.L. ; Loebs, V.A.
Author_Institution
Boeing Co., Seattle, WA, USA
Volume
24
Issue
4
fYear
2001
fDate
11/1/2001 12:00:00 AM
Firstpage
576
Lastpage
585
Abstract
A highly accurate prediction of hermeticity lifetime is made for eutectic 63Sn37Pb and 80Au20Sn alloy solder sealed optical fiber-Kovar TM nosetube feedthroughs subjected to repetitive thermal cycling. Thermal fatigue fracture of the Sn-Pb solder/KovarTM interface develops when cracks, initially generated from creep deformation of the solder, propagate gradually through the junction in the axial direction. A nonlinear axisymmetric finite element analysis of the 63Sn37Pb fiber feedthrough seal is performed using a thermo-elastic creep constitutive equation, and solder joint fatigue based on accumulated strain energy associated with solder creep imposed by temperature cycling is analyzed. Additionally, thermal effective stress and plastic strain is studied for alternative 80Au20Sn solder by the finite element method with results indicating significant increase in useful life as compared to 63Sn37Pb. SEM/EDX metallurgical analysis of the solder/Ni-Au plated KovarTM nosetube interface indicates that AuSn4 intermetallic formed during soldering with 63Sn37Pb also contributes to joint weakening, whereas no brittle intermetallic is observed for 80Au20Sn. Hermetic carbon coated optical fibers metallized with Ni,P-Ni underplate and electrolytic Au overplating exhibit correspondingly similar metallurgy at the solder/fiber interface. Combined hermeticity testing and metallurgical analysis carried out on 63Sn37Pb and 80Au20Sn alloy solder sealed optical fiber feedthroughs after repetitive temperature cycling between -65 and +150°C, and -40 and +125°C validated the analytical approach
Keywords
creep; finite element analysis; gold alloys; lead alloys; optical fibres; scanning electron microscopy; seals (stoppers); soldering; thermal stress cracking; thermoelasticity; tin alloys; -40 to 125 C; -65 to 150 C; Au; Au-Sn; C; Kovar nosetube; Ni-Au; Ni-Au plating; NiP-Ni; NiP-Ni underplate; SEM/EDX metallurgical analysis; Sn-Pb; carbon coating; cracks; electrolytic Au overplating; eutectic alloy solder; hermeticity lifetime; intermetallic compound formation; metallization; nonlinear axisymmetric finite element analysis; plastic strain; sealed optical fiber feedthrough; strain energy; thermal cycling; thermal fatigue fracture; thermal stress; thermoelastic creep constitutive equation; Capacitive sensors; Creep; Fatigue; Fiber nonlinear optics; Finite element methods; Optical fibers; Performance analysis; Soldering; Temperature; Thermal stresses;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/6040.982847
Filename
982847
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