• DocumentCode
    1560302
  • Title

    Comparative investigation on numerical de-embedding techniques for equivalent circuit modeling of lumped and distributed microstrip circuits

  • Author

    Zhu, Lei ; Wu, Ke

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • Volume
    12
  • Issue
    2
  • fYear
    2002
  • Firstpage
    51
  • Lastpage
    53
  • Abstract
    A so-called "short-open calibration" (SOC) technique is applied together with two existing numerical de-embedding techniques for equivalent circuit modeling of microstrip circuits based on a full-wave method-of-moments (MoM) algorithm. A stub-loaded microstrip line discontinuity with both electrically short (lumped) and long (distributed) stub lengths is extensively studied in terms of its Z-matrix circuit model. Our obtained results show that the SOC scheme allows an accurate calibration of all the potential error terms out of the core circuit network, thereby avoiding numerical noise-related behaviors regardless of either lumped or distributed circuits, which are nevertheless observed for the two existing techniques.
  • Keywords
    calibration; distributed parameter networks; equivalent circuits; lumped parameter networks; method of moments; microstrip circuits; microstrip discontinuities; numerical stability; two-port networks; Z-matrix circuit model; accurate calibration; admittance-type algorithm; core circuit network; distributed microstrip circuits; electrically long stub lengths; electrically short stub lengths; equivalent circuit modeling; external feed lines; full-wave method-of-moments algorithm; lumped microstrip circuits; numerical de-embedding techniques; numerical instability; potential error terms; short-open calibration; stub-loaded microstrip line discontinuity; two-ports network; Calibration; Character generation; Circuit noise; Circuit simulation; Equivalent circuits; Feeds; Iterative algorithms; Microstrip; Moment methods; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/7260.982874
  • Filename
    982874