DocumentCode :
1560312
Title :
ICP registration using invariant features
Author :
Sharp, Gregory C. ; Lee, Sang W. ; Wehe, David K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
24
Issue :
1
fYear :
2002
fDate :
1/1/2002 12:00:00 AM
Firstpage :
90
Lastpage :
102
Abstract :
Investigates the use of Euclidean invariant features in a generalization of iterative closest point (ICP) registration of range images. Pointwise correspondences are chosen as the closest point with respect to a weighted linear combination of positional and feature distances. It is shown that, under ideal noise-free conditions, correspondences formed using this distance function are correct more often than correspondences formed using the positional distance alone. In addition, monotonic convergence to at least a local minimum is shown to hold for this method. When noise is present, a method that automatically sets the optimal relative contribution of features and positions is described. This method trades off the error in feature values due to noise against the error in positions due to misalignment. Experimental results suggest that using invariant features decreases the probability of being trapped in a local minimum and may be an effective solution for difficult range image registration problems where the scene is very small compared to the model
Keywords :
convergence of numerical methods; errors; feature extraction; image registration; invariance; iterative methods; minimisation; noise; Euclidean invariant features; distance function; feature detection; feature distance; ideal noise-free conditions; iterative closest point registration; local minimum; misalignment; monotonic convergence; optimal relative contribution; pointwise correspondences; positional distance; range image registration; small scenes; weighted linear combination; Application software; Computer graphics; Computer vision; Convergence; Image registration; Iterative algorithms; Iterative closest point algorithm; Layout; Least squares approximation; Robustness;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.982886
Filename :
982886
Link To Document :
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