Title :
On optimal pairwise linear classifiers for normal distributions: the two-dimensional case
Author :
Rueda, Luis ; Oommen, B. John
Author_Institution :
Sch. of Comput. Sci., Carleton Univ., Ottawa, Ont., Canada
fDate :
2/1/2002 12:00:00 AM
Abstract :
Optimal Bayesian linear classifiers have been studied in the literature for many decades. We demonstrate that all the known results consider only the scenario when the quadratic polynomial has coincident roots. Indeed, we present a complete analysis of the case when the optimal classifier between two normally distributed classes is pairwise and linear. We focus on some special cases of the normal distribution with nonequal covariance matrices. We determine the conditions that the mean vectors and covariance matrices have to satisfy in order to obtain the optimal pairwise linear classifier. As opposed to the state of the art, in all the cases discussed here, the linear classifier is given by a pair of straight lines, which is a particular case of the general equation of second degree. We also provide some empirical results, using synthetic data for the Minsky´s paradox case, and demonstrated that the linear classifier achieves very good performance. Finally, we have tested our approach on real life data obtained from the UCI machine learning repository. The empirical results that we obtained show the superiority of our scheme over the traditional Fisher´s discriminant classifier
Keywords :
Bayes methods; covariance matrices; normal distribution; optimisation; pattern classification; Minsky paradox; UCI machine learning repository; coincident roots; nonequal covariance matrices; normal distributions; optimal Bayesian linear classifiers; optimal pairwise linear classifier; optimal pairwise linear classifiers; perceptron; quadratic polynomial; Bayesian methods; Computer aided software engineering; Covariance matrix; Equations; Gaussian distribution; Life testing; Machine learning; Pattern recognition; Polynomials; Vectors;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on