DocumentCode
1560360
Title
Development of thin-film multijunction thermal converters at PTB/IPHT
Author
Klonz, Manfred ; Laiz, Héctor ; Kessler, Ernst
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume
50
Issue
6
fYear
2001
fDate
12/1/2001 12:00:00 AM
Firstpage
1490
Lastpage
1498
Abstract
The thin-film multijunction thermal converter (PMJTC) developed in cooperation between Physikalisch-Technische Bundesanstalt (PTB) and Institut fur Physikalische Hochtechnologie e.V. (IPHT) is today´s most sensitive and accurate standard for the precise measurement of electrical AC quantities in the frequency range of 10 Hz-1 MHz. Thin-film technology and micromechanics in silicon were essential for this success. The thin-film heater and bismuth/antimony thermocouples with high Seebeck effect deposited on a thin membrane of low heat conductance result in the attractively high sensitivity of the PMJTC which allows voltage measurements down to 100 mV to be performed. The statistics of the mass production of the PMJTCs show that PMJTCs built into a housing with an N-connector at the input can be reproducebly manufactured with an AC-DC voltage transfer difference smaller than 0.1 μV/V at 1 kHz, 8 μV/V up to 100 kHz, and below 40 μV/V up to 1 MHz for a heater resistance of 90 Ω. A compensation circuit has been added on the chip which results in low-frequency PMJTCs (LF-PMJTCs) with AC-DC transfer differences below 0.3 μV/V at 10 Hz
Keywords
Seebeck effect; convertors; etching; micromachining; microsensors; thermocouples; thin film devices; transfer standards; voltage measurement; 10 Hz to 1 MHz; 90 ohm; AC-DC voltage transfer difference; anisotropic etching; compensation circuit; electrical AC quantities; high Seebeck effect; mass production; measurement standard; stress-compensated sandwich membrane; thermocouples; thin dielectric membrane; thin-film heater; thin-film multijunction thermal converter; voltage measurements; Bismuth; Electric variables measurement; Frequency conversion; Frequency measurement; Measurement standards; Semiconductor thin films; Silicon; Sputtering; Standards development; Transistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.982933
Filename
982933
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