Title :
Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography
Author :
Giakos, George C. ; Guntupalli, R. ; Shah, N. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Nemer, R. ; Passerini, A.G. ; Mehta, K. ; Sumrain, S. ; Patnekar, N. ; Nataraj, K. ; Evans, E.A. ; Endorf, R. ; Russo, Fabrizio
Author_Institution :
Dept. of Electr. Eng., Akron Univ., OH, USA
fDate :
12/1/2001 12:00:00 AM
Abstract :
The detected contrast and dynamic ranges of Cd1-xZnxTe semiconductor detectors have been measured, within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent detected contrast response and large dynamic range
Keywords :
II-VI semiconductors; X-ray detection; cadmium compounds; diagnostic radiography; semiconductor devices; sensitivity; zinc compounds; Cd1-xZnxTe semiconductors; CdZnTe; CdZnTe semiconductor detectors; X-ray diagnostic energy range; contrast sensitivity phantom; detected contrast response; dynamic ranges; flat panel digital radiographic applications; image quality parameters optimisation; medical imaging; solid state ionization devices; Dynamic range; Energy measurement; Image quality; Imaging phantoms; Solid state circuits; Tellurium; X-ray detection; X-ray detectors; X-ray imaging; Zinc;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
