Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography

Author

Giakos, George C. ; Guntupalli, R. ; Shah, N. ; Vedantham, S. ; Suryanarayanan, S. ; Chowdhury, S. ; Nemer, R. ; Passerini, A.G. ; Mehta, K. ; Sumrain, S. ; Patnekar, N. ; Nataraj, K. ; Evans, E.A. ; Endorf, R. ; Russo, Fabrizio

Author_Institution

Dept. of Electr. Eng., Akron Univ., OH, USA

Volume

50

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

1604

Lastpage

1609

Abstract

The detected contrast and dynamic ranges of Cd_1-xZn_xTe semiconductor detectors have been measured, within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd_1-xZn_xTe detectors have excellent detected contrast response and large dynamic range

Keywords

II-VI semiconductors; X-ray detection; cadmium compounds; diagnostic radiography; semiconductor devices; sensitivity; zinc compounds; Cd_1-xZn_xTe semiconductors; CdZnTe; CdZnTe semiconductor detectors; X-ray diagnostic energy range; contrast sensitivity phantom; detected contrast response; dynamic ranges; flat panel digital radiographic applications; image quality parameters optimisation; medical imaging; solid state ionization devices; Dynamic range; Energy measurement; Image quality; Imaging phantoms; Solid state circuits; Tellurium; X-ray detection; X-ray detectors; X-ray imaging; Zinc;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.982953

Filename

982953