Proton-induced CCD charge transfer degradation at low-operating temperatures

Author

Hopkinson, Gordon R.

Author_Institution

Sira Electro-Optics Ltd., Chislehurst, UK

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

1790

Lastpage

1795

Abstract

Measurements of charge transfer inefficiency (CTI) at charge-coupled device temperatures ~-100°C show that proton-induced E-centers can be kept filled but other traps with energies 0.22-0.34 eV limit the achievable improvement in CTI. Estimates of trap energy levels and concentrations are made from CTI and emission time measurements. It is found that the CTI can be reduced for low signal levels. Implications for spaceborne astronomical instruments are discussed

Keywords

astronomical instruments; charge exchange; charge-coupled devices; colour centres; cryogenic electronics; electron traps; proton effects; radiation hardening (electronics); -100 C; charge transfer inefficiency; charge-coupled device; emission time; low-operating temperatures; proton-induced CCD charge transfer degradation; proton-induced E-centers; spaceborne astronomical instruments; trap concentrations; trap energy levels; traps; Charge coupled devices; Charge measurement; Charge transfer; Current measurement; Degradation; Energy measurement; Energy states; Extraterrestrial measurements; Temperature; Time measurement;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983132

Filename

983132