A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the Hubble Space Telescope Wide-Field Camera 3

Author

Waczynski, Augustyn ; Polidan, Elizabeth J. ; Marshall, Paul W. ; Reed, Robert A. ; Johnson, Scott D. ; Hill, Robert J. ; Delo, Gregory S. ; Wassell, Edward J. ; Cheng, Edward S.

Author_Institution

Global Sci. & Technol., NASA Goddard Space Flight Center, Greenbelt, MD, USA

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

1807

Lastpage

1814

Abstract

We examine proton-damaged charge-coupled devices (CCDs) and compare the charge transfer efficiency (CTE) degradation using extended pixel edge response, first pixel response, and ⁵⁵Fe X-ray measurements. CTEs measured on Marconi and Fairchild imaging sensors CCDs degrade similarly at all signal levels, though some of the Fairchild CCDs had a supplementary buried channel

Keywords

CCD image sensors; X-ray detection; astronomical instruments; astronomical telescopes; integrated circuit measurement; proton effects; radiation hardening (electronics); ⁵⁵Fe X-ray measurements; CTE degradation; Fairchild CCDs; Fairchild imaging sensors; HST; Hubble Space Telescope; Marconi CCD; WFC 3; WFC3; Wide Field Camera 3; charge transfer efficiency; charge transfer efficiency measurement; extended pixel edge response; first pixel response; proton damaged n-channel CCD; proton-damaged charge-coupled device; supplementary buried channel; Cameras; Charge coupled devices; Charge transfer; Degradation; Measurement techniques; NASA; Protons; Space technology; Telescopes; Testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983134

Filename

983134