Title :
Complex SEU signatures in high-speed analog-to-digital conversion
Author :
Ladbury, Ray ; Marshall, Paul W. ; Buchner, Steffen ; Campbell, A.B. ; Reed, R.A. ; Seidleck, C. ; Assad, A.
fDate :
12/1/2001 12:00:00 AM
Abstract :
The complex single-event upset (SEU) signatures produced, by high-speed analog-to-digital converter devices are analyzed to establish magnitude, duration, and pattern characteristics. Histograms and other descriptive summaries of event characteristics are identified and their use in performing system effects analysis is described
Keywords :
analogue-digital conversion; high-speed techniques; integrated circuit testing; ion beam effects; proton effects; radiation hardening (electronics); ADC; SEU signatures; complex single-event upset; event characteristics; high-speed analog-digital conversion; high-speed converter devices; histograms; ion radiation; pattern characteristics; proton radiation; system effects analysis; Analog-digital conversion; Broadband amplifiers; Circuits; Clocks; Histograms; NASA; Pulse width modulation; Single event upset; Space technology; Wideband;
Journal_Title :
Nuclear Science, IEEE Transactions on
